Self-directed portfolio targeting semiconductor internships.
Tools: EDA Playground · Icarus Verilog
Concepts: Scan design, shift-capture-shift, SA1 fault detection
Tools: Verilog, EDA Playground, Icarus Verilog 12.0
- Designed a scan-enabled DFF with SE-controlled 2:1 MUX
- Chained 8 scan FFs and verified full shift→capture→shift cycle
- Injected SA1 fault on d[0] (wire shorted to VDD)
- Proved fault is invisible during scan shift-in but detected after capture phase — exactly how ATE detects manufacturing defects
| Fault-free | SA1 on d[0] | |
|---|---|---|
| Capture response | 00000000 |
00000001 |
| Shift-out | 00000000 |
00000001 |
| Result | — | DETECTED ✓ |
